TID Effects in Reconfigurable MOSFETs Using 2-D Semiconductor WSe2

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2018
Source ID
10.1109/tns.2017.2771149

Entities

People

  • Harold L. Hughes
  • Hassaram Bakhru
  • Ji Ung Lee
  • Prathamesh Dhakras
  • Pratik Agnihotri

Organizations

  • Defense Threat Reduction Agency
  • National Science Foundation

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene