Electrical Transport Degradation of Chemically Doped Electronic-Type-Separated Single-Wall Carbon Nanotubes From Radiation-Induced Defects

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2018
Source ID
10.1109/tns.2017.2779580

Entities

People

  • Andrew R Bucossi
  • Brian J. Landi
  • Cory D. Cress
  • Ivan Puchades
  • Jamie E. Rossi
  • Karen J. Soule
  • Nathanael D Cox

Organizations

  • Defense Threat Reduction Agency
  • Federal Government of the United States
  • Intelligence Community Postdoctoral Research Fellowship Program

Tags

Technology Areas

  • Microelectronics