Frequency Dependence of Heavy-Ion-Induced Single-Event Responses of Flip-Flops in a 16-nm Bulk FinFET Technology

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2018
Source ID
10.1109/tns.2017.2779785

Entities

People

  • Bharat Bhuva
  • H. Jiang
  • H. Zhang
  • J. S. Kauppila
  • L. W. Massengill
  • W. T. Holman

Organizations

  • Defense Threat Reduction Agency