The Impact of Charge Collection Volume and Parasitic Capacitance on SEUs in SOI- and Bulk-FinFET D Flip-Flops

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2018
Source ID
10.1109/tns.2017.2784763

Entities

People

  • Andrew L. Sternberg
  • Bharat Bhuva
  • Dennis R. Ball
  • En Xia Zhang
  • J. A. Maharrey
  • J. D. Rowe
  • J. S. Kauppila
  • L. W. Massengill
  • M. L. Alles
  • Patrick Nsengiyumva
  • R. C. Harrington
  • T. D. Haeffner

Organizations

  • Defense Threat Reduction Agency