Predicting Muon-Induced SEU Rates for a 28-nm SRAM Using Protons and Heavy Ions to Calibrate the Sensitive Volume Model

Document Details

Document Type
Pub Defense Publication
Publication Date
Feb 01, 2018
Source ID
10.1109/tns.2017.2786585

Entities

People

  • B. Bartz
  • B. Narasimham
  • Brian D. Sierawski
  • Domonique Reed
  • James M. Trippe
  • Kevin M. Warren
  • L. W. Massengill
  • R. A. Austin
  • Robert A. Reed
  • Robert A. Weller
  • Ronald D. Schrimpf

Organizations

  • Defense Threat Reduction Agency