Effect of Transistor Variants on Single-Event Transients at the 14-/16-nm Bulk FinFET Technology Generation

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 01, 2018
Source ID
10.1109/tns.2018.2843260

Entities

People

  • Bharat Bhuva
  • Dennis R. Ball
  • En Xia Zhang
  • J. A. Maharrey
  • J. S. Kauppila
  • L. W. Massengill
  • Patrick Nsengiyumva
  • R. C. Harrington
  • T. D. Haeffner

Organizations

  • Defense Threat Reduction Agency