Total-Ionizing-Dose Effects on Al/SiO2 Bimorph Electrothermal Microscanners

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 01, 2018
Source ID
10.1109/tns.2018.2853139

Entities

People

  • Andrew L. Sternberg
  • Charles N. Arutt
  • Daniel M. Fleetwood
  • Dingkang Wang
  • En Xia Zhang
  • Huikai Xie
  • Michael L. Alles
  • Michael W. McCurdy
  • Pan Wang
  • Robert A. Reed
  • Ronald D. Schrimpf
  • Simeng Zhao
  • Wenjun Liao

Organizations

  • Defense Threat Reduction Agency