Measurement of Electron Mobility-Lifetime Product in 3-D Position-Sensitive CdZnTe Detectors Using the VAD_UMv2.2 Digital Readout System
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Nov 01, 2018
- Source ID
- 10.1109/tns.2018.2876021
Entities
People
- Jiawei Xia
- Michael Streicher
- Yuefeng Zhu
- Zhong He
Organizations
- Defense Threat Reduction Agency