A Multifield and Frequency Electrically Detected Magnetic Resonance Study of Atomic-Scale Defects in Gamma Irradiated Modern MOS Integrated Circuitry

Document Details

Document Type: Pub Defense Publication
Publication Date: Jan 01, 2019
Source ID: 10.1109/tns.2018.2880119

Entities

People

Chadwin D Young
Kenneth J. Myers
Patrick M. Lenahan
Ryan J Waskiewicz

Organizations

Defense Threat Reduction Agency