Total-Ionizing-Dose Response of MoS2Transistors With ZrO2and h-BN Gate Dielectrics

Document Details

Document Type
Pub Defense Publication
Publication Date
Jul 01, 2019
Source ID
10.1109/tns.2018.2885751

Entities

People

  • Adithi Krishnaprasad
  • Andrew O'Hara
  • Daniel M. Fleetwood
  • Durjoy Dev
  • En Xia Zhang
  • Hirokjyoti Kalita
  • Pan Wang
  • Ronald D. Schrimpf
  • Rong Jiang
  • Sokrates T. Pantelides
  • Tania Roy

Organizations

  • Defense Threat Reduction Agency