The Effects of Temperature on the Single-Event Transient Response of a High-Voltage (>30 V) Complementary SiGe-on-SOI Technology

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2019
Source ID
10.1109/tns.2018.2886577

Entities

People

  • Adilson S. Cardoso
  • Adrian Ildefonso
  • Ani Khachatrian
  • Anup P. Omprakash
  • Dale McMorrow
  • George N. Tzintzarov
  • Jeffrey A. Babcock
  • Jeffrey H. Warner
  • John D. Cressler
  • Rajarshi Mukhopadhyay
  • S. Büchner
  • Zachary E. Fleetwood

Organizations

  • Defense Threat Reduction Agency
  • Texas Instruments