Comparison of Single-Event Transients in SiGe HBTs on Bulk and Thick-Film SOI

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2020
Source ID
10.1109/tns.2019.2950864

Entities

People

  • Adrian Ildefonso
  • Ani Khachatrian
  • Anup P. Omprakash
  • Dale McMorrow
  • Delgermaa Nergui
  • George N. Tzintzarov
  • Jeffrey H. Warner
  • Joel M. Hales
  • John D. Cressler
  • Patrick S. Goley
  • S. Büchner

Organizations

  • Defense Threat Reduction Agency
  • National Science Foundation