Observation of Radiation-Induced Leakage Current Defects in MOS Oxides With Multifrequency Electrically Detected Magnetic Resonance and Near-Zero-Field Magnetoresistance
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 01, 2020
- Source ID
- 10.1109/tns.2019.2958351
Entities
People
- James P. Ashton
- Michael E. Flatté
- Nicholas J. Harmon
- Patrick M. Lenahan
- Sean W. King
- Stephen J. Moxim
Organizations
- Defense Threat Reduction Agency