Single-Event Transients in SiGe HBTs Induced by Pulsed X-Ray Microbeam

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2020
Source ID
10.1109/tns.2019.2959973

Entities

People

  • Adrian Ildefonso
  • Anup P. Omprakash
  • Dale L Brewe
  • Daniele M. Monahan
  • Delgermaa Nergui
  • George N. Tzintzarov
  • Hunter Kettering
  • Jeremy P. Bonsall
  • John D. Cressler
  • Nelson E. Lourenco
  • Patrick S. Goley
  • S. D. LaLumondiere
  • Zachary E. Fleetwood

Organizations

  • Defense Threat Reduction Agency
  • United States Department of Energy