Total-Ionizing-Dose Effects, Border Traps, and 1/f Noise in Emerging MOS Technologies
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jul 01, 2020
- Source ID
- 10.1109/tns.2020.2971861
Entities
People
- Daniel M. Fleetwood
Organizations
- Air Force Office of Scientific Research
- Defense Threat Reduction Agency