Sensitive-Volume Model of Single-Event Latchup for a 180-nm SRAM Test Structure

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 01, 2020
Source ID
10.1109/tns.2020.2996080

Entities

People

  • Andrew L. Sternberg
  • Andrew M. Tonigan
  • Brian D. Sierawski
  • Daniel M. Fleetwood
  • En Xia Zhang
  • Gyorgy Vizkelethy
  • Kevin M. Warren
  • Nathaniel A. Dodds
  • Peng Wang
  • Rachel M. Brewer
  • Robert A. Reed
  • Ronald D. Schrimpf
  • Scott L. Jordan

Organizations

  • Defense Threat Reduction Agency