Single-Event Upsets in a 7-nm Bulk FinFET Technology With Analysis of Threshold Voltage Dependence

Document Details

Document Type
Pub Defense Publication
Publication Date
May 01, 2021
Source ID
10.1109/tns.2021.3050719

Entities

People

  • Balaji Narasimham
  • Bharat Bhuva
  • Dennis R. Ball
  • J. S. Kauppila
  • Jingchen Cao
  • Joseph D'Amico
  • L. W. Massengill
  • Lyuan Xu
  • Mike Rathore
  • Rita Fung
  • Shi-jie Wen

Organizations

  • Defense Threat Reduction Agency