Total Ionizing Dose Responses of 22-nm FDSOI and 14-nm Bulk FinFET Charge-Trap Transistors

Document Details

Document Type
Pub Defense Publication
Publication Date
May 01, 2021
Source ID
10.1109/tns.2021.3059594

Entities

People

  • Brian D. Sierawski
  • Daniel M. Fleetwood
  • Dennis R. Ball
  • En Xia Zhang
  • Jonathan Cox
  • Mariia Gorchichko
  • Michael L. Alles
  • Pengfei Wang
  • Rachel M. Brewer
  • Ronald D. Schrimpf
  • Steven L. Moran
  • Subramanian Iyer

Organizations

  • Defense Advanced Research Projects Agency
  • Defense Threat Reduction Agency
  • University of California, Los Angeles