Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs

Document Details

Document Type
Pub Defense Publication
Publication Date
May 01, 2021
Source ID
10.1109/tns.2021.3065563

Entities

People

  • Anne Jourdain
  • Daniel M. Fleetwood
  • En Xia Zhang
  • Gaspard Hiblot
  • K. Li
  • Mahmud Reaz
  • Mariia Gorchichko
  • Michael L. Alles
  • Pengfei Wang
  • Robert A. Reed
  • Ronald D. Schrimpf
  • Simeng Zhao
  • Stefaan Van Huylenbroeck

Organizations

  • Air Force Office of Scientific Research
  • Defense Threat Reduction Agency