Total-Ionizing-Dose Response of Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors

Document Details

Document Type
Pub Defense Publication
Publication Date
May 01, 2021
Source ID
10.1109/tns.2021.3066612

Entities

People

  • Daniel M. Fleetwood
  • Dimitri Linten
  • En Xia Zhang
  • Jerome Mitard
  • Mariia Gorchichko
  • Pan Wang
  • Robert A. Reed
  • Ronald D. Schrimpf
  • Stefano Bonaldo

Organizations

  • Air Force Office of Scientific Research
  • Air Force Research Laboratory