Single-Event-Induced Charge Collection in Ge-Channel pMOS FinFETs

Document Details

Document Type
Pub Defense Publication
Publication Date
May 01, 2021
Source ID
10.1109/tns.2021.3072068

Entities

People

  • Andrew L. Sternberg
  • Daniel M. Fleetwood
  • Dimitri Linten
  • En Xia Zhang
  • Isaak K. Samsel
  • Jerome Mitard
  • K. Li
  • M. W. Rony
  • Mahmud Reaz
  • Michael L. Alles
  • Robert A. Reed
  • Ronald D. Schrimpf
  • Stephanie M. Austin

Organizations

  • Defense Threat Reduction Agency