Simulation of Pulsed-Laser-Induced Testing in Microelectronic Devices

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 01, 2021
Source ID
10.1109/tns.2021.3111864

Entities

People

  • Andrew L. Sternberg
  • Ani Khachatrian
  • Chuanmin Wang
  • Dale McMorrow
  • Joel M. Hales
  • John A. Kozub
  • Kaitlyn L. Ryder
  • Landen D. Ryder
  • Liang Wang
  • Robert A. Reed
  • Robert A. Weller
  • Ronald D. Schrimpf
  • S. Büchner
  • Sharon M Weiss
  • Yuanfu Zhao

Organizations

  • Defense Threat Reduction Agency

Tags

Technology Areas

  • Directed Energy
  • Microelectronics