In Situ Measurement of TID-Induced Leakage Using On-Chip Frequency Modulation
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Mar 01, 2022
- Source ID
- 10.1109/tns.2021.3135415
Entities
People
- A. C. Watkins
- D. S. Vibbert
- Dennis R. Ball
- En Xia Zhang
- J. S. Kauppila
- Joseph D'Amico
- L. W. Massengill
- M. L. Alles
- M. W. Mckinney
- Sean T. Vibbert
- T. D. Haeffner
Organizations
- Defense Threat Reduction Agency
- United States Army