TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses

Document Details

Document Type
Pub Defense Publication
Publication Date
Jul 01, 2022
Source ID
10.1109/tns.2022.3142385

Entities

People

  • A. Paccagnella
  • Daniel M. Fleetwood
  • Dimitri Linten
  • En Xia Zhang
  • Jerome Mitard
  • Mariia Gorchichko
  • Marta Bagatin
  • Robert A. Reed
  • Ronald D. Schrimpf
  • Serena Mattiazzo
  • Simone Gerardin
  • Stefano Bonaldo
  • Teng Ma

Organizations

  • Air Force Office of Scientific Research
  • Air Force Research Laboratory
  • Interuniversity Microelectronics Centre
  • Istituto Nazionale di Fisica Nucleare
  • Vanderbilt University