Mitigating Total-Ionizing-Dose-Induced Threshold-Voltage Shifts Using Back-Gate Biasing in 22-nm FD-SOI Transistors
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Mar 01, 2022
- Source ID
- 10.1109/tns.2022.3146318
Entities
People
- A. C. Watkins
- Dennis R. Ball
- En Xia Zhang
- J. S. Kauppila
- Joseph D'Amico
- Kevin M. Warren
- L. W. Massengill
- M. L. Alles
- Sean T. Vibbert
- T. D. Haeffner
Organizations
- Defense Threat Reduction Agency
- Office of the Secretary of Defense