Effects of Bias and Temperature on Interface-Trap Annealing in MOS and Linear Bipolar Devices
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Mar 01, 2022
- Source ID
- 10.1109/tns.2022.3147771
Entities
People
- Daniel M. Fleetwood
Organizations
- Air Force Office of Scientific Research
- Air Force Research Laboratory
- Defense Threat Reduction Agency
- United States Department of Defense