Analysis of Single-Event Upsets and Transients in 22 nm Fully Depleted Silicon-On-Insulator Logic
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Apr 01, 2023
- Source ID
- 10.1109/tns.2023.3237178
Entities
People
- A. C. Watkins
- Andrew L. Sternberg
- Benjamin C. Fahrenkrug
- Dennis R. Ball
- J. S. Kauppila
- Joseph D'Amico
- L. W. Massengill
- Michael L. Alles
- Sean T. Vibbert
- T. D. Haeffner
Organizations
- Defense Threat Reduction Agency
- Vanderbilt University