Effects of Interface Traps and Hydrogen on the Low-Frequency Noise of Irradiated MOS Devices

Document Details

Document Type
Pub Defense Publication
Publication Date
Apr 01, 2024
Source ID
10.1109/tns.2023.3323548

Entities

People

  • Daniel M. Fleetwood
  • En Xia Zhang
  • Ronald D. Schrimpf
  • Sokrates T. Pantelides
  • Stefano Bonaldo

Organizations

  • Air Force Office of Scientific Research
  • University of Padua
  • Vanderbilt University