Dynamic RON Characterization Technique for the Evaluation of Thermal and Off-State Voltage Stress of GaN Switches

Document Details

Document Type
Pub Defense Publication
Publication Date
Apr 01, 2018
Source ID
10.1109/tpel.2017.2710281

Entities

People

  • Alberto Santarelli
  • Corrado Florian
  • Tommaso Cappello

Organizations

  • Defense Advanced Research Projects Agency
  • Office of Naval Research