High-Scalability Enhanced Gate Drivers for SiC MOSFET Modules With Transient Immunity Beyond 100 V/ns

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 01, 2020
Source ID
10.1109/tpel.2020.2980564

Entities

People

  • Dushan Boroyevich
  • Jun Wang
  • Rolando Burgos
  • Slavko Mocevic

Organizations

  • Office of Naval Research
  • United States Department of Energy