Technique to Determine Intense Electron Beam Parameters and X-Ray Spectra From Dose-Rate Measurements at Different Angles

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 01, 2020
Source ID
10.1109/tps.2020.3020503

Entities

People

  • B.V. Weber
  • David D. Hinshelwood
  • I. M. Rittersdorf
  • S. B. Swanekamp
  • Timothy J. Renk

Organizations

  • Defense Threat Reduction Agency

Tags

Technology Areas

  • Directed Energy
  • Microelectronics