Evaluation of Long-Term Reliability and Overcurrent Capabilities of 15-kV SiC MOSFETs and 20-kV SiC IGBTs During Narrow Current Pulsed Conditions

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 01, 2020
Source ID
10.1109/tps.2020.3030295

Entities

People

  • Aderinto A. Ogunniyi
  • Argenis Bilbao
  • Emily A. Hirsch
  • Heather O'Brien
  • J. J. Forbes
  • James Schrock
  • Matthew Kim
  • Shelby Lacouture
  • Stephen Bayne

Organizations

  • United States Army Research Laboratory