Finite Element Analysis of Fabrication- and Operation-Induced Mechanical Stress in AlGaN/GaN Transistors

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 01, 2016
Source ID
10.1109/tsm.2016.2600593

Entities

People

  • Allen Hanson
  • Chuanxin Lian
  • Rajesh Baskaran
  • Sameer Joglekar
  • Tomás Palacios
  • Yan Zhang

Organizations

  • Office of Naval Research