Electronic Calibration for Submillimeter-Wave On-Wafer Scattering Parameter Measurements Using Schottky Diodes
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Nov 01, 2020
- Source ID
- 10.1109/tthz.2020.3006744
Entities
People
- Alexander Arsenovic
- Arthur. W. Lichtenberger
- Linli Xie
- Matthew F. Bauwens
- Michael E. Cyberey
- Nicolas Barker
- Robert Weikle
- Souheil Nadri
Organizations
- Air Force Office of Scientific Research
- National Science Foundation