Built-In Self-Test Methodology With Statistical Analysis for Electrical Diagnosis of Wearout in a Static Random Access Memory Array

Document Details

Document Type
Pub Defense Publication
Publication Date
Jul 01, 2016
Source ID
10.1109/tvlsi.2015.2513369

Entities

People

  • Chang-chih Chen
  • Dae-hyun Kim
  • Linda Milor
  • Woongrae Kim

Organizations

  • Defense Advanced Research Projects Agency