System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability and Hot Carrier Injection

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 01, 2016
Source ID
10.1109/tvlsi.2016.2520658

Entities

People

  • Chang-chih Chen
  • Linda Milor
  • Taizhi Liu

Organizations

  • Defense Advanced Research Projects Agency
  • National Science Foundation