Negative Bias Temperature Instability and Gate Oxide Breakdown Modeling in Circuits With Die-to-Die Calibration Through Power Supply and Ground Signal Measurements

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 01, 2017
Source ID
10.1109/tvlsi.2017.2683261

Entities

People

  • Linda Milor
  • Soonyoung Cha
  • Taizhi Liu

Organizations

  • Defense Advanced Research Projects Agency
  • National Science Foundation