Fast Electromigration Stress Evolution Analysis for Interconnect Trees Using Krylov Subspace Method

Document Details

Document Type: Pub Defense Publication
Publication Date: May 01, 2018
Source ID: 10.1109/tvlsi.2018.2800707

Entities

People

Chase Cook
Ertugrul Demircan
Mehul D. Shroff
Sheldon X.-D. Tan
Zeyu Sun

Organizations

Defense Advanced Research Projects Agency
National Science Foundation