A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both Traditional CMOS and FinFET Technology

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 01, 2018
Source ID
10.1109/tvlsi.2018.2861769

Entities

People

  • Kexin Yang
  • Linda Milor
  • Rui Zhang
  • Taizhi Liu

Organizations

  • Defense Advanced Research Projects Agency