Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits

Document Details

Document Type
Pub Defense Publication
Publication Date
Feb 01, 2021
Source ID
10.1109/tvlsi.2020.3045417

Entities

People

  • Arjun Chaudhuri
  • August Ning
  • Krishnendu Chakrabarty
  • Sanmitra Banerjee