Special Session: Machine Learning for Semiconductor Test and Reliability

Document Details

Document Type
Pub Defense Publication
Publication Date
Apr 25, 2021
Source ID
10.1109/vts50974.2021.9441052

Entities

People

  • Animesh Basak Chowdhury
  • Benjamin Tan
  • Farshad Khorrami
  • Hussam Amrouch
  • Ilia Polian
  • Prashanth Krishnamurthy
  • Ramesh Karri
  • Sheldon X.-D. Tan
  • Victor M. Van Santen
  • Wentian Jin

Organizations

  • Office of Naval Research

Tags

Technology Areas

  • AI & ML
  • AI & ML - Bayesian Inference
  • AI & ML - Neural Networks
  • Microelectronics