Short Circuit Fault Induced Failure of SiC MOSFETs in DC Solid-State Circuit Breakers

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 07, 2022
Source ID
10.1109/wipda56483.2022.9955271

Entities

People

  • Hua Zhang
  • Lu Fei
  • Reza Kheirollahi
  • Shuyan Zhao

Organizations

  • Defense Advanced Research Projects Agency
  • Drexel University
  • Rowan University
  • United States Department of Energy