The Change of X‐ray Diffraction Peak Width During in situ Conventional Sintering of Nanoscale Powders
Abstract
Diffraction peaks of nanoscale particles of 3 mol% yttria‐stabilized zirconia become sharper as the powder sinters. The reduction in the peak width is correlated with the increase in density. The sharpening of the peak agrees reasonably well with the remaining free surface area as the sample sinters. Therefore, high curvature of the free surface of the pores is assumed to lead to peak broadening (the grain boundaries that grow at the expense of the free surfaces of the pores do not have this curvature). The change in the grain size during sintering does not make a significant contribution to peak width.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 22, 2016
- Source ID
- 10.1111/jace.14112
Entities
People
- Jean‐Marie Lebrun
- Kevin C. Seymour
- Kiran S. Naik
- Rishi Raj
- Shikhar Krishn Jha
- Waltraud M. Kriven
Organizations
- Argonne National Laboratory
- Office of Basic Energy Sciences
- Office of Naval Research
- Saint-Gobain
- United States Department of Energy
- University of Colorado Boulder
- University of Illinois Urbana–Champaign