Cation grain‐boundary diffusivity in SiO2‐ and MgO‐doped Al2O3
Abstract
Cation grain‐boundary diffusion in undoped and aliovalent‐doped Al2O3 is characterized using Cr2O3 as a chemical tracer. The compositional depth profiles measured by secondary ion mass spectrometry are fitted to the Whipple‐LeClaire model. The results indicate that cation grain‐boundary diffusivity is insensitive to MgO and SiO2 dopants between 1100°C and 1300°C.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Aug 21, 2017
- Source ID
- 10.1111/jace.15104
Entities
People
- Lin Feng
- Shen J Dillon
Organizations
- Office of Naval Research Global
- University of Illinois Urbana–Champaign