Phase transition and energy storage behavior of antiferroelectric PLZT thin films epitaxially deposited on SRO buffered STO single crystal substrates
Abstract
(Pb0.98, La0.02)(Zr0.95, Ti0.05)O3 (PLZT) thin films of 300 nm thickness were epitaxially deposited on (100), (110), and (111) SrTiO3 single crystal substrates by pulsed laser deposition. X‐ray diffraction line and reciprocal space mapping scans were used to determine the crystal structure. Tetragonal ((001) PLZT) and monoclinic MA ((011) and (111) PLZT) structures were found, which influenced the stored energy density. Electric field‐induced antiferroelectric to ferroelectric (AFE→FE) phase transitions were found to have a large reversible energy density of up to 30 J/cm3. With increasing temperature, an AFE to relaxor ferroelectric (AFE→RFE) transition was found. The RFE phase exhibited lower energy loss, and an improved energy storage efficiency. The results are discussed from the perspective of crystal structure, dielectric phase transitions, and energy storage characteristics. Besides, unipolar drive was also performed, providing notably higher energy storage efficiency values due to low energy losses.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Feb 25, 2019
- Source ID
- 10.1111/jace.16380
Entities
People
- Chung Ming Leung
- D. Viehland
- Jiefang Li
- Min Gao
- Steve Dai
- Xiao Tang
Organizations
- Air Force Office of Scientific Research
- Sandia National Laboratories
- United States Department of Energy
- Virginia Tech