L's approach: illumination pattern estimation technique for optical microscopy
Abstract
We propose a novel solution to the correction of illumination nonuniformity without removing the imaging sample. Calibration of the spatial illumination pattern in reflectance microscopy is challenging due to the fact that the illumination source is colocated with the objective lens and therefore cannot be observed directly. Our proposed methodology overcomes this by collecting three spatially translated images in a strategic way. We prove that ‘log‐illumination pattern’ recovery can be reformulated as a deconvolution of log‐ratio of captured images, and develop an efficient, noise‐robust implementation. Experiments with simulated and reflectance microscopy data verify the effectiveness of our proposed approach.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Oct 30, 2020
- Source ID
- 10.1111/jmi.12968
Entities
People
- Charles Brookshire
- Keigo Hirakawa
- Michael Uchic
- Tyler Lesthaeghe
- Victoria Kramb
Organizations
- Air Force Research Laboratory
- Purdue University
- University of Dayton