Improved a-B10C2+xHy/Si p-n heterojunction performance after neutron irradiation

Abstract

The impact of neutron irradiation, in the energy range of ∼0.025 eV, on amorphous semiconducting partially dehydrogenated boron carbide (a-B10C2+xHy) on silicon p-n heterojunction diodes was investigated. The heterojunction devices were created by synthesizing a-B10C2+xHy via plasma enhanced chemical vapor deposition on n-type silicon. Unlike many electronic devices, the performance of the a-B10C2+xHy heterojunction diode improved with neutron irradiation, in spite of the large neutron cross section of 10B. There is also increased charge carrier lifetime of more than 200% with modest neutron irradiation of approximately 2.7 × 108 to 1.08 × 109 neutrons/cm2.

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2018
Source ID
10.1116/1.5008999

Entities

People

  • George Peterson
  • Michael Nastasi
  • Natale J. Ianno
  • Peter A Dowben
  • Qing Su
  • Yongqiang Wang

Organizations

  • Los Alamos National Laboratory
  • Office of Naval Research
  • United States Department of Energy
  • University of Nebraska–Lincoln

Tags

Fields of Study

  • Physics

Readers

  • Nuclear and Radiation Engineering.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene