Band offsets at metalorganic chemical vapor deposited β-(AlxGa1−x)2O3/β-Ga2O3 interfaces—Crystalline orientation dependence
Abstract
The β-(AlxGa1−x)2O3 alloy represents an emerging ultrawide bandgap semiconductor material for applications in high-power electronics and deep ultraviolet optoelectronics. The recent demonstrations of orientation-dependent epitaxial growth of high quality β-(AlxGa1−x)2O3 films have unlocked prospects for the development of ultrahigh frequency β-(AlxGa1−x)2O3/Ga2O3 based transistors with high-power tolerance. To control the electronic and optical properties of β-(AlxGa1−x)2O3/Ga2O3 heterostructure-based devices, an understanding of the band offsets between β-(AlxGa1−x)2O3 and β-Ga2O3 is crucial. However, there have been no systematic experimental studies on the evolution of the band offsets between differently oriented β-(AlxGa1−x)2O3/Ga2O3 heterointerfaces as a function of Al compositions. This work presents the valence and conduction band offsets at (010) and (2¯01) oriented β-(AlxGa1−x)2O3/Ga2O3 interfaces using x-ray photoelectron spectroscopy. β-(AlxGa1−x)2O3 films with x ≤ 0.35 and x ≤ 0.48 were grown by metalorganic chemical vapor deposition on (010) and (2¯01) oriented β-Ga2O3 substrates, respectively. The determined band offsets reveal the formation of a type-II (staggered) band alignment at (010) oriented β-(AlxGa1−x)2O3/Ga2O3 and a type-I (straddling) heterojunction between (2¯01) β-(AlxGa1−x)2O3 and β-Ga2O3. For both crystalline orientations, the valence and conduction band offsets are found to increase with increasing Al content with a much weaker variation in the valence band offsets as compared to the conduction band offsets. Among different orientations investigated, such as (010), (2¯01), and (100), the largest conduction band offset occurs at a β-(AlxGa1−x)2O3/Ga2O3 interface with (100) orientation, providing opportunities for excellent electron confinement with a high-density two-dimensional electron gas. Results from this study on the tunable and orientation-dependent band offsets with the variation of the Al alloy fraction will provide guidance for the design of heterostructures in future β-(AlxGa1−x)2O3/Ga2O3 based devices.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Sep 22, 2021
- Source ID
- 10.1116/6.0001260
Entities
People
- A F M Anhar Uddin Bhuiyan
- Hongping Zhao
- Hsien-lien Huang
- Jinwoo Hwang
- Lingyu Meng
- Zixuan Feng
Organizations
- Air Force Office of Scientific Research
- National Science Foundation
- Ohio State University
- Semiconductor Research Corporation