Noise reduction and peak detection in x-ray diffraction data by linear and nonlinear methods
Abstract
Considerable progress has been made in the last few years in removing white noise from visible–near-ultraviolet (UV/VIS) spectra while leaving information intact. For x-ray diffraction, the challenges are different: detecting and locating peaks rather than line shape analysis. Here, we investigate possibilities of state-of-the-art UV/VIS methods for noise reduction, peak detection, and peak location applied to x-ray diffraction data, in this case, data for a ZrO2 −33 mol. % TaO4 ceramic. The same advantages seen in UV/VIS spectroscopy are found here as well.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jun 06, 2023
- Source ID
- 10.1116/6.0002526
Entities
People
- David E. Aspnes
- H.N.G. Wadley
- Jeroen A. Deijkers
- Long V. Le
- Young Dong Kim
Organizations
- Institute of Materials Science
- Kyung Hee University
- National Research Foundation of Korea
- North Carolina State University
- Office of Naval Research
- University of Virginia
- Vietnam Academy of Science and Technology