Waveguide metatronics: Lumped circuitry based on structural dispersion
Abstract
A microwave test bed for metatronic “lumped” circuitry is introduced by exploiting structural dispersion in waveguides.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jun 03, 2016
- Source ID
- 10.1126/sciadv.1501790
Entities
People
- Cristian Della Giovampaola
- Iñigo Liberal
- Nader Engheta
- Yue Li
Organizations
- Air Force Office of Scientific Research
- National Natural Science Foundation of China
- Office of Naval Research
- Tsinghua University
- University of Pennsylvania
- University of Siena